A Revolutionary Process

C|D|I has developed a unique process for the deterministic production of carbon nanotube (CNT) devices. This process allows C|D|I to predictably produce CNTs with specified geometries and properties such as angle and length that offer many benefits for AFM.

CNTs are one of the smallest, toughest, and most thermally conductive structures known to scientists. CNT technology was extremely exciting research when introduced 15 years ago, but the inability to reliably and predictably manufacture CNTs has severely limited continued application development. C|D|I has the Intellectual Property (IP) needed to radically change that paradigm. The ability to predictably manufacture CNTs for AFM probes opens up new avenues for AFM science.

Straight, Strong, Durable

A patent pending production process for making CNT AFM probes allows C|D|I to reproducibly straighten the CNT and attach it to the probe so that the angle is normal to the surface when imaging.

C|D|I’s proprietary attachment process secures the CNT tip to the probe creating strength and stability for both high-resolution and high-aspect ratio probes. Finally, the inherent hardness of a CNT probe offers the durability to give it a higher lifetime than offered by silicon probes.

The result is a suite of AFM probes that offer customers reduced cost of ownership, higher resolution and the ability to get simply better images.

Why CNTs for Atomic Force Microscopy?

Carbon nanotubes (CNTs) provide the ideal structure for atomic force microscopy (AFM) imaging and critical dimension characterization. A true carbon nanotube provides a robust probe capable of long-lifetime high-aspect ratio imaging for both materials science and life sciences applications. When compared to a carbon fiber, Si, or SiN probe, a true carbon nanotube is extremely tough and wear resistant -- easily offering 10x the lifetime of the others. Si and SiN are brittle materials and can chip and wear upon approach and continually degrade thereafter while imaging.

C|D|I CNT AFM probes do not chip upon approach and wear down considerably more slowly allowing the AFM user to compare images without loss of resolution.

Compare C|D|I CNT Probes for AFM with the other available CNT probes

The patent pending technology used by C|D|I provides CNT probes that uniquely address many of the problems encountered by users of other CNT probes available today.