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Application Images with Carbon Design Innovation Probes |
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Metrology Deep-Trench Images of 90nm Trench Structure using standard Si and C|D|I CNT AFM Probe |
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The CCHAR high-aspect ratio CNT AFM probes, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard CNT probe length is approximately 1µm overall with < 500nm of exposed CNT tip. These two dimensions can also be custom engineered to user specifications.
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